Testing Complex and Embedded Systems (English Edition)

Testing Complex and Embedded Systems (English Edition)

作者
Kim H. Pries、Jon M. Quigley
语言
英语
出版社
CRC Press
出版日期
2018年9月3日
纸书页数
319页
电子书格式
epub,pdf,mobi,azw3,txt,fb2,djvu
文件大小
7217 KB
下载次数
8126
更新日期
2023-04-06
运行环境
PC/Windows/Linux/Mac/IOS/iPhone/iPad/iBooks/Kindle/Android/安卓/平板
内容简介

Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the corrective work being performed in a rush and at the last minute.

Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing.

Details how to manage multiple test hardware and software deliveries

Examines the contradictory perspectives of testing—including ordered/ random, structured /unstructured, bench/field, and repeatable/non repeatable

Covers essential planning activities prior to testing, how to scope the work, and how to reach a successful conclusion

Explains how to determine when testing is complete

Where you find organizations that are successful at product development, you are likely to find groups that practice disciplined, strategic, and thorough testing. Tapping into the authors’ decades of experience managing test groups in the automotive industry, this book provides the understanding to help ensure your organization joins the likes of these groups.

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